Correlative microscopy and techniques with atom probe tomography: Opportunities in materials science

نویسندگان

چکیده

Abstract In the last decade, applicability of atom probe tomography (APT) has been strongly extended from highly conductive materials such as metals and alloys to semiconductors insulators well more sophisticated systems. However, can only provide information about composition for most these complex materials, while correlation between other material properties structural, functional, mechanical remains challenging be analyzed by APT alone. Therefore, various groups worldwide have put notable efforts recently in combining with microscopy methods techniques ex situ goal understand composition–property interrelationships at same position sample. Hence, present work not provides a short overview works, but also describes three examples possible opportunities science when using correlative tomography. Graphical abstract

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ژورنال

عنوان ژورنال: Mrs Bulletin

سال: 2022

ISSN: ['1938-1425', '0883-7694']

DOI: https://doi.org/10.1557/s43577-022-00369-4